Skip to content

test(autogram): Remove batch_dim param when unused#455

Merged
ValerianRey merged 1 commit intomainfrom
remove-unused-batch_dim
Oct 13, 2025
Merged

test(autogram): Remove batch_dim param when unused#455
ValerianRey merged 1 commit intomainfrom
remove-unused-batch_dim

Conversation

@ValerianRey
Copy link
Copy Markdown
Contributor

No description provided.

@ValerianRey ValerianRey added cc: test Conventional commit type for changes to tests. package: autogram labels Oct 13, 2025
@ValerianRey ValerianRey self-assigned this Oct 13, 2025
@codecov
Copy link
Copy Markdown

codecov bot commented Oct 13, 2025

Codecov Report

✅ All modified and coverable lines are covered by tests.

🚀 New features to boost your workflow:
  • ❄️ Test Analytics: Detect flaky tests, report on failures, and find test suite problems.

@ValerianRey ValerianRey merged commit 28cce93 into main Oct 13, 2025
17 checks passed
@ValerianRey ValerianRey deleted the remove-unused-batch_dim branch October 13, 2025 18:09
Sign up for free to join this conversation on GitHub. Already have an account? Sign in to comment

Labels

cc: test Conventional commit type for changes to tests. package: autogram

Projects

None yet

Development

Successfully merging this pull request may close these issues.

1 participant