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Combinational Circuit Simulator (Phase 1)

This repository contains the implementation of a Combinational Circuit Simulator developed as part of the Testability course project. The project focuses on the fundamental concepts of VLSI testing, specifically implementing logic-level and timing-aware simulations for ISCAS benchmarks.

Project Overview

The simulator is designed to process standard ISCAS-style circuit netlists (.isc) and perform two distinct types of simulation:

  1. True-Value (Logic) Simulation: A functional simulator to determine the correct output state of the circuit given specific input vectors.
  2. Event-Driven Gate-Delay Simulation: A more advanced implementation that accounts for propagation delays in logic gates using an event-driven queue, allowing for accurate timing analysis and hazard detection.

Technical Features

  • Netlist Parser: Handles reading and mapping ISCAS .isc file formats into internal data structures.
  • Event-Driven Architecture: Efficiently processes signal transitions, minimizing redundant calculations.
  • Support for Benchmarks: Tested and validated with standard circuits like newbyte.isc and t.isc.
  • Waveform Analysis: Supports custom test patterns for verification.

Project Structure

.
├── True_sim.py           # Core logic simulation script
├── Delay_sim.py          # Event-driven delay simulation script
├── newbyte.isc           # Benchmark circuit file
├── t.isc                 # Benchmark circuit file
├── wave-form/            # Directory containing input test vectors
│   ├── 1.txt
│   └── 2.txt
└── .gitignore            # Git ignore configuration

Related Project

This repository contains Phase 1 of the Testability course project, focused on combinational circuit simulation.

For the continuation of this work on fault simulation and fault coverage analysis, see:

  • Phase 2 — ISC Fault Simulator: isc-fault-simulator

Phase 2 extends the simulation framework developed in this repository to support stuck-at fault modeling, serial fault simulation, and fault coverage evaluation.

About

Combinational circuit simulator for ISC benchmarks supporting True-Value and Event-Driven Gate-Delay simulation. Built for VLSI testing purposes.

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